Telcordia software to calculate the reliability prediction of electronic equipment based on the Telcordia (Bellcore) TR and SR standards. Free trial. Telcordia Telecom Information SuperStore – Reliability Prediction Procedure for The following documents were fully or partly replaced by SR TR Bellcore TR – Download as PDF File .pdf), Text File .txt) or read online.
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A model known as the modified Coffin-Manson model has been used successfully to model crack growth in solder due to repeated temperature cycling as the device is switched on and off. Since electronic products usually have a long time period of useful life i.
FAQ: What is Telcordia (Bellcore) SR?
However, if you think your products do not exhibit a constant failure rate and therefore cannot be described by an exponential distribution, the life characteristic usually will not be the MTBF. However, the objective of reliability prediction is not limited to predicting whether reliability goals, such as MTBF, can be reached.
For this example, the life of an electronic component is considered to be affected by temperature. A brief summary from the publications in industry, military and academia is presented next . The table below lists some of the available prediction standards and the following sections describe two of the most commonly used methods in a bit more detail.
Therefore, the prediction is usually more accurate, given that trr-332 samples are used in the testing. Each approach has its unique advantages and disadvantages.
This leads to the concept of reliability prediction. The following documents were fully or partly replaced by SR These standards use a series of models for various categories of electronic, electrical and electro-mechanical components to predict steady-state failure rates which environmental conditions, quality levels, electrical stress conditions and various other parameters affect.
If the parameters cannot be determined without conducting a test, the failure data obtained from the test can be used to get the model parameters. This approach is based upon an understanding of the physical properties of the materials, operation processes and technologies used in the design.
Telcordia Electronic Reliability Prediction Software to TR and SR Standards
The component is tested under temperatures ofand Kelvin. Each reliability prediction module is designed to analyse and calculate component, sub system and system failure rates, including Mean Time Between Failure MTBFin accordance with the appropriate standard. Hot carrier injection describes the phenomena observed in MOSFETs by which the carrier gains sufficient energy to be injected into the gate oxide, generate interface or bulk oxide defects and degrade MOSFETs characteristics such as threshold voltage, transconductance, etc.
Bellcore capacitor failure rate example. The usage temperature level is Kelvin. Notice 1 in and Notice 2 in Empirical bellxore Standards Based Prediction Methods Empirical prediction methods are based on models developed from statistical curve fitting of historical failure data, which may have been collected in the field, in-house or from manufacturers.
It can also be used for: Bellxore and unit failure rate predictions generated using this procedure are applicable for commercial electronic products whose physical design, manufacture, installation, and reliability assurance practices meet the appropriate Telcordia or equivalent generic and product-specific requirements.
The Black model employs external heating and increased current density and is given by:. Three factors are usually considered for testing: Tables needed to facilitate the calculation of reliability predictions. The models allow reliability prediction to be performed using three methods for belocore product reliability:. After the analysis is complete, ITEM ToolKit’s integrated environment comes into its own with powerful conversion facilities for transferring data to other modules of the program.
Predictions based on field data The Telcordia standard also documents a recommended method for predicting serial system hardware reliability. View Table of Contents Payment Processing.
Bellcore/Telcordia Reliability Prediction in Lambda Predict
Predictions based on field data The Telcordia standard also documents a recommended method for predicting serial system hardware reliability. For example, for the Weibull distribution, the life characteristic is the scale parameter eta and for the lognormal distribution, it is the log mean. Some have gained popularity within industry in the past three decades. Using this equation, the parameters B and C calculated by ALTA can easily be transformed to the parameters described above for the Arrhenius relationship.
Sitemap Legal Privacy Contact Us. The Telcordia Reliability Prediction Procedure has a long and distinguished history of use within and outside the telecommunications industry. This assumes that there are no interaction failures between the components but, in reality, due to the design or manufacturing, components are not independent. Issue 4 of SR provides all the tools needed for predicting device and unit hardware reliability, and contains important revisions since the document was last issued.
The current density J bellcor temperature T are factors in the design process that affect electromigration. According to the handbook, the failure rate of a commercial ceramic capacitor of 0. Empirical prediction methods are based on models developed from statistical curve fitting of historical failure data, which may have been collected in the field, in-house or from manufacturers.
Belllcore to Request Price Quote. Features Powerful and user friendly Telcordia bellcoge standard reliability prediction software Combine prediction methods for complex analysis Optimize designs to meet targeed goals Select components with regard to reliability and cost savings Be more accurate and efficient than with manual methods Take advantage of powerful ‘what if’ analytical tools Identify weakareas in a system design Build and open multiple systems and projects files Drag and drop components and systems between projects Powerful charting facilities.
Notice 1 and Notice 2 This lends the procedure and tr-332 predictions derived from it a high level of credibility free from the bias of any individual supplier or service provider. As new sub blocks and components are added, ITEM ToolKit automatically recalculates all dependent failure rates to take account of new information.
Users can construct hierarchical breakdowns of systems with no restrictions on block numbers or levels of indenture. Parts Count Method II: Among these approaches, three main categories are often used within government and industry: